Assignee
WANG LYNN T
US·2 granted patents·22 citations·filing 2012–2012
Top patents by PatentIndex Score
2 records- 0186US8418105B1Methods for pattern matching in a double patterning technology-compliant physical design flowWANG LYNN T·Filed 2012·Granted Apr 9, 2013·13 cites·15 claims
- 0282US8516407B1Methods for quantitatively evaluating the quality of double patterning technology-compliant layoutsWANG LYNN T·Filed 2012·Granted Aug 20, 2013·9 cites·19 claims
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