Assignee
WANG MILL-JER
TW·9 granted patents·60 citations·filing 2011–2012
Top patents by PatentIndex Score
9 records- 0195US9086452B2Three-dimensional integrated circuit and method for wireless information access thereofWANG MILL-JER·Filed 2012·Granted Jul 21, 2015·26 cites·20 claims
- 0293US8957691B2Probe cards for probing integrated circuitsWANG MILL-JER·Filed 2011·Granted Feb 17, 2015·12 cites·22 claims
- 0391US8922230B23D IC testing apparatusWANG MILL-JER·Filed 2011·Granted Dec 30, 2014·10 cites·14 claims
- 0480US8866488B2Power compensation in 3DIC testingWANG MILL-JER·Filed 2011·Granted Oct 21, 2014·4 cites·20 claims
- 0579US9817029B2Test probing structureWANG MILL-JER·Filed 2011·Granted Nov 14, 2017·4 cites·20 claims
- 0668US9129973B2Circuit probing structures and methods for probing the sameWANG MILL-JER·Filed 2011·Granted Sep 8, 2015·2 cites·19 claims
- 0765US8952711B2Methods for probing semiconductor wafersWANG MILL-JER·Filed 2011·Granted Feb 10, 2015·1 cites·20 claims
- 0864US8614105B2Production flow and reusable testing methodWANG MILL-JER·Filed 2011·Granted Dec 24, 2013·1 cites·25 claims
- 0948US8836355B2Dynamic testing based on thermal and stress conditionsWANG MILL-JER·Filed 2011·Granted Sep 16, 2014·0 cites·20 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →