Assignee
WATANABE YUICHI
JP·7 granted patents·2 pending applications·10 citations·filing 2005–2012
Top patents by PatentIndex Score
9 records- 0172US8736295B2Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing methodWATANABE YUICHI·Filed 2010·Granted May 27, 2014·4 cites·9 claims
- 0266US8743409B2Information processing apparatus and method of processing informationWATANABE YUICHI·Filed 2011·Granted Jun 3, 2014·1 cites·28 claims
- 0365US8203736B2Image forming apparatusWATANABE YUICHI·Filed 2008·Granted Jun 19, 2012·1 cites·8 claims
- 0462US8896108B2Semiconductor device with parasitic bipolar transistorWATANABE YUICHI·Filed 2011·Granted Nov 25, 2014·2 cites·20 claims
- 0561US8416431B2Image processing apparatus that can obtain management information from different sourcesWATANABE YUICHI·Filed 2006·Granted Apr 9, 2013·2 cites·19 claims
- 0656US8462649B2Communication deviceWATANABE YUICHI·Filed 2009·Granted Jun 11, 2013·0 cites·6 claims
- 0754US8427690B2Method for reading sequentially a manuscript group made of plural sheetsWATANABE YUICHI·Filed 2012·Granted Apr 23, 2013·0 cites·14 claims
- 0845US2006095602A1Multi-function systemWATANABE YUICHI·Filed 2005·Application pending·0 cites
- 0940US2010302584A1Image forming apparatusWATANABE YUICHI·Filed 2010·Application pending·0 cites
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