Assignee
WAVECREST CORP
US·10 granted patents·4 pending applications·292 citations·filing 1998–2006
Top patents by PatentIndex Score
14 records- 0191US6356850B1Method and apparatus for jitter analysisWAVECREST CORP·Filed 1999·Granted Mar 12, 2002·82 cites·37 claims
- 0282US6449570B1Analysis of noise in repetitive waveformsWAVECREST CORP·Filed 2000·Granted Sep 10, 2002·24 cites·9 claims
- 0382US6185509B1Analysis of noise in repetitive waveformsWAVECREST CORP·Filed 1998·Granted Feb 6, 2001·46 cites·20 claims
- 0478US6298315B1Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 1998·Granted Oct 2, 2001·64 cites·17 claims
- 0576US6799144B2Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 2001·Granted Sep 28, 2004·18 cites·74 claims
- 0669US6194925B1Time interval measurement system incorporating a linear ramp generation circuitWAVECREST CORP·Filed 1998·Granted Feb 27, 2001·24 cites·17 claims
- 0766US6393088B1Measurement system with a frequency-dividing edge counterWAVECREST CORP·Filed 2001·Granted May 21, 2002·13 cites·15 claims
- 0865US7016805B2Method and apparatus for analyzing a distributionWAVECREST CORP·Filed 2001·Granted Mar 21, 2006·11 cites·129 claims
- 0960US7305312B2Method and apparatus for recording a real time signalWAVECREST CORP·Filed 2006·Granted Dec 4, 2007·2 cites·8 claims
- 1057US6813589B2Method and apparatus for determining system response characteristicsWAVECREST CORP·Filed 2001·Granted Nov 2, 2004·8 cites·34 claims
- 1147US2005027477A1Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 2004·Application pending·0 cites
- 1244US2002120420A1Method and apparatus for jitter analysisWAVECREST CORP·Filed 2001·Application pending·0 cites
- 1335US2004001194A1Electromagnetic and optical analyzerWAVECREST CORP·Filed 2002·Application pending·0 cites
- 1435US2001028262A1Time interval measurement system incorporating a linear ramp generation circuitWAVECREST CORP·Filed 2000·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →