Assignee
WEIZMAN YOAV
IL·4 granted patents·6 citations·filing 2006–2012
Top patents by PatentIndex Score
4 records- 0169US9671456B2Semiconductor device arrangement, a method of analysing a performance of a functional circuit on a semiconductor device and a device analysis systemWEIZMAN YOAV·Filed 2012·Granted Jun 6, 2017·4 cites·14 claims
- 0252US8134384B2Method for testing noise immunity of an integrated circuit and a device having noise immunity testing capabilitiesWEIZMAN YOAV·Filed 2006·Granted Mar 13, 2012·2 cites·20 claims
- 0343US8430562B2Device and method for evaluating a temperatureWEIZMAN YOAV·Filed 2011·Granted Apr 30, 2013·0 cites·20 claims
- 0441US8070357B2Device and method for evaluating a temperatureWEIZMAN YOAV·Filed 2008·Granted Dec 6, 2011·0 cites·20 claims
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