Assignee

WON HYOSIG

KR·1 granted patent·10 citations·filing 2015–2015

Technology mixG01R1 G11C1 H01L1 H10D1 H10P1

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0181US10026661B2Semiconductor device for testing large number of devices and composing method and test method thereofWON HYOSIG·Filed 2015·Granted Jul 17, 2018·10 cites·19 claims

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