Assignee
WU YIDER
US·3 granted patents·2 pending applications·7 citations·filing 2005–2012
Top patents by PatentIndex Score
5 records- 0176US8802537B1System and method for improving reliability in a semiconductor deviceWU YIDER·Filed 2005·Granted Aug 12, 2014·6 cites·12 claims
- 0258US8476156B1Manufacturing method of flash memory structure with stress areaWU YIDER·Filed 2011·Granted Jul 2, 2013·1 cites·7 claims
- 0339US8759894B1System and method for reducing cross-coupling noise between charge storage elements in a semiconductor deviceWU YIDER·Filed 2005·Granted Jun 24, 2014·0 cites·13 claims
- 0436US2014030860A1Manufacturing method of tunnel oxide of nor flash memoryWU YIDER·Filed 2012·Application pending·0 cites
- 0534US2012094450A1Manufacturing method of multi-level cell nor flash memoryWU YIDER·Filed 2010·Application pending·0 cites
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