Assignee
XIONG YAN
CN·3 granted patents·35 citations·filing 2006–2011
Top patents by PatentIndex Score
3 records- 0192US8112241B2Methods and systems for generating an inspection process for a waferXIONG YAN·Filed 2009·Granted Feb 7, 2012·33 cites·28 claims
- 0260US8107415B2Method and system for transferring time division multiplexing service dataXIONG YAN·Filed 2006·Granted Jan 31, 2012·2 cites·20 claims
- 0347US8717970B2Method and system for transferring time division multiplexing service dataXIONG YAN·Filed 2011·Granted May 6, 2014·0 cites·16 claims
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