Assignee

YAMAGUCHI ATSUKO

JP·2 granted patents·23 citations·filing 2009–2010

Technology mixG06T2 G01B1 G01Q1 G02B1 H01J1 H01L1

Top patents by PatentIndex Score

2 records

0188US8300919B2Apparatus for data analysisYAMAGUCHI ATSUKO·Filed 2009·Granted Oct 30, 2012·22 cites·12 claims
0260US9123504B2Semiconductor inspection device and semiconductor inspection method using the sameYAMAGUCHI ATSUKO·Filed 2010·Granted Sep 1, 2015·1 cites·3 claims

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