Assignee
YAMAZAKI MINORU
JP·5 granted patents·15 citations·filing 2007–2012
Top patents by PatentIndex Score
5 records- 0186US8263934B2Method for detecting information of an electric potential on a sample and charged particle beam apparatusYAMAZAKI MINORU·Filed 2007·Granted Sep 11, 2012·7 cites·18 claims
- 0284US8080790B2Scanning electron microscopeYAMAZAKI MINORU·Filed 2009·Granted Dec 20, 2011·7 cites·20 claims
- 0357US8487250B2Method for detecting information of an electronic potential on a sample and charged particle beam apparatusYAMAZAKI MINORU·Filed 2012·Granted Jul 16, 2013·0 cites·11 claims
- 0453US8487253B2Scanning electron microscopeYAMAZAKI MINORU·Filed 2011·Granted Jul 16, 2013·0 cites·6 claims
- 0549US8827675B2Mold for insert moldingYAMAZAKI MINORU·Filed 2012·Granted Sep 9, 2014·1 cites·2 claims
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