Assignee
YANG HYUNG GYUN
KR·3 granted patents·7 citations·filing 2011–2012
Top patents by PatentIndex Score
3 records- 0177US8618541B2Semiconductor apparatusYANG HYUNG GYUN·Filed 2011·Granted Dec 31, 2013·5 cites·20 claims
- 0258US8811101B2SIP semiconductor systemYANG HYUNG GYUN·Filed 2012·Granted Aug 19, 2014·2 cites·22 claims
- 0340US8918685B2Test circuit, memory system, and test method of memory systemYANG HYUNG-GYUN·Filed 2012·Granted Dec 23, 2014·0 cites·25 claims
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