Assignee
YANG YUN-CHI
TW·1 granted patent·2 pending applications·0 citations·filing 2007–2010
Top patents by PatentIndex Score
3 records- 0133US2009278170A1Semiconductor device and manufacturing method thereofYANG YUN-CHI·Filed 2008·Application pending·0 cites
- 0231US2008270056A1Wafer-level reliability yield enhancement system and related methodYANG YUN-CHI·Filed 2007·Application pending·0 cites
- 0322US8510635B2Method for evaluating failure rateYANG YUN-CHI·Filed 2010·Granted Aug 13, 2013·0 cites·4 claims
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