Assignee
YIELD DYNAMICS INC
US·4 granted patents·99 citations·filing 1999–2003
Top patents by PatentIndex Score
4 records- 0177US6718224B2System and method for estimating error in a manufacturing processYIELD DYNAMICS INC·Filed 2001·Granted Apr 6, 2004·28 cites·23 claims
- 0274US6884147B2Method for chemical-mechanical polish control in semiconductor manufacturingYIELD DYNAMICS INC·Filed 2003·Granted Apr 26, 2005·16 cites·23 claims
- 0374US6643596B2System and method for controlling critical dimension in a semiconductor manufacturing processYIELD DYNAMICS INC·Filed 2001·Granted Nov 4, 2003·18 cites·22 claims
- 0469US6470229B1Semiconductor yield management system and methodYIELD DYNAMICS INC·Filed 1999·Granted Oct 22, 2002·37 cites·22 claims
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