Assignee
YONEYAMA TAKASHI
JP·2 granted patents·7 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0179US8730315B2Microscope apparatus and microscope observation methodYONEYAMA TAKASHI·Filed 2010·Granted May 20, 2014·6 cites·8 claims
- 0258US8890947B2Microscope apparatus and method for image acquisition of specimen slides having scattered specimensYONEYAMA TAKASHI·Filed 2011·Granted Nov 18, 2014·1 cites·16 claims
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