Assignee
YOSHIKAWA SATORU
JP·2 granted patents·1 pending application·6 citations·filing 2007–2012
Top patents by PatentIndex Score
3 records- 0168US8134383B2LSI test apparatus, LSI test method, and computer productYOSHIKAWA SATORU·Filed 2007·Granted Mar 13, 2012·6 cites·10 claims
- 0248US8183256B2Remedy or preventive for integration dysfunction syndromeYOSHIKAWA SATORU·Filed 2008·Granted May 22, 2012·0 cites·3 claims
- 0335US2012314461A1Power converterYOSHIKAWA SATORU·Filed 2012·Application pending·0 cites
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