Assignee
YOSHIKAWA YASUHIRO
JP·3 granted patents·11 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0175US9390766B2Semiconductor device and electronic deviceYOSHIKAWA YASUHIRO·Filed 2012·Granted Jul 12, 2016·5 cites·8 claims
- 0274US8183688B2Semiconductor deviceYOSHIKAWA YASUHIRO·Filed 2011·Granted May 22, 2012·3 cites·5 claims
- 0373US8241926B2Semiconductor integrated circuit test methodYOSHIKAWA YASUHIRO·Filed 2010·Granted Aug 14, 2012·3 cites·13 claims
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