Assignee

YOSHITAKE YASUHIRO

JP·2 granted patents·2 citations·filing 2009–2010

Technology mixG01M1 G01N1 G06T1 G06V1 H04N1

Top patents by PatentIndex Score

2 records

0152US8121398B2Method and apparatus for inspecting defectsYOSHITAKE YASUHIRO·Filed 2009·Granted Feb 21, 2012·2 cites·22 claims
0236US8705024B2Wavefront aberration measuring method and device thereforYOSHITAKE YASUHIRO·Filed 2010·Granted Apr 22, 2014·0 cites·9 claims

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