Assignee
YOUNG SCOTT A
US·3 granted patents·20 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0190US9553034B1Combined semiconductor metrology systemYOUNG SCOTT A·Filed 2012·Granted Jan 24, 2017·15 cites·28 claims
- 0273US8643835B2Active planar autofocusYOUNG SCOTT A·Filed 2010·Granted Feb 4, 2014·4 cites·6 claims
- 0357US9170231B2Quantification and characterization of allergensYOUNG SCOTT A·Filed 2011·Granted Oct 27, 2015·1 cites·12 claims
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