Assignee
YOUNGTEK ELECTRONICS CORP
TW·17 granted patents·3 pending applications·98 citations·filing 2001–2022
Top patents by PatentIndex Score
20 records- 0195US8031930B2Testing system and testing method for inspecting electonic devicesYOUNGTEK ELECTRONICS CORP·Filed 2008·Granted Oct 4, 2011·64 cites·17 claims
- 0282US11145565B2Method of fabricating a chip package module with improve heat dissipation effectYOUNGTEK ELECTRONICS CORP·Filed 2020·Granted Oct 12, 2021·2 cites·15 claims
- 0364US7253028B2Image sensor packaging method and structure thereofYOUNGTEK ELECTRONICS CORP·Filed 2004·Granted Aug 7, 2007·14 cites·14 claims
- 0462US7489251B2Real-time tracing, transmitting and analyzing system for flight animalsYOUNGTEK ELECTRONICS CORP·Filed 2006·Granted Feb 10, 2009·3 cites·8 claims
- 0559US6423906B2Surface mount package for long lead devicesYOUNGTEK ELECTRONICS CORP·Filed 2001·Granted Jul 23, 2002·7 cites·2 claims
- 0656US7391365B2Micro-tracking device for tracing action track of animals and method for using the sameYOUNGTEK ELECTRONICS CORP·Filed 2006·Granted Jun 24, 2008·3 cites·13 claims
- 0756US7329028B2Uniform light generating system for adjusting output brightness and method of using the sameYOUNGTEK ELECTRONICS CORP·Filed 2006·Granted Feb 12, 2008·2 cites·26 claims
- 0853US9029725B2Packaged chip detection and classification deviceYOUNGTEK ELECTRONICS CORP·Filed 2013·Granted May 12, 2015·0 cites·8 claims
- 0952US7379171B2Optical object distance simulation deviceYOUNGTEK ELECTRONICS CORP·Filed 2006·Granted May 27, 2008·2 cites·9 claims
- 1050US11531065B2Multi-channel timing calibration device and methodYOUNGTEK ELECTRONICS CORP·Filed 2021·Granted Dec 20, 2022·0 cites·10 claims
- 1150US7256603B1Apparatus for measuring the static parameters of integrated circuitsYOUNGTEK ELECTRONICS CORP·Filed 2006·Granted Aug 14, 2007·1 cites·10 claims
- 1249US12444627B2Method for transferring objects and transfer apparatus using the sameYOUNGTEK ELECTRONICS CORP·Filed 2022·Granted Oct 14, 2025·0 cites·23 claims
- 1348US11809262B2Power adjustment circuit, adjustable power supply system and adjustable power supply methodYOUNGTEK ELECTRONICS CORP·Filed 2021·Granted Nov 7, 2023·0 cites·16 claims
- 1447US2010166290A1Die defect inspecting system with a die defect inspecting function and a method of using the sameYOUNGTEK ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 1545US7898663B2Uniform light generating system for testing an image-sensing device and method of using the sameYOUNGTEK ELECTRONICS CORP·Filed 2008·Granted Mar 1, 2011·0 cites·20 claims
- 1645US7800841B2Optical object distance simulation device for reducing total optical pathYOUNGTEK ELECTRONICS CORP·Filed 2008·Granted Sep 21, 2010·0 cites·7 claims
- 1729US7163829B2Method of integration testing for packaged electronic componentsYOUNGTEK ELECTRONICS CORP·Filed 2005·Granted Jan 16, 2007·0 cites·10 claims
- 1829US2016339603A1Method for splitting circlesYOUNGTEK ELECTRONICS CORP·Filed 2015·Application pending·0 cites
- 1927US2006226848A1Mass-production LED test device for mass productionYOUNGTEK ELECTRONICS CORP·Filed 2005·Application pending·0 cites
- 2023US7062697B2Pre-stored digital word generatorYOUNGTEK ELECTRONICS CORP·Filed 2004·Granted Jun 13, 2006·0 cites·7 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →