Assignee
YUN TAE SIK
KR·14 granted patents·53 citations·filing 2009–2012
Top patents by PatentIndex Score
14 records- 0191US8953407B2Sub word line driver and semiconductor integrated circuit deviceYUN TAE SIK·Filed 2012·Granted Feb 10, 2015·18 cites·8 claims
- 0280US8411478B2Three-dimensional stacked semiconductor integrated circuitYUN TAE SIK·Filed 2010·Granted Apr 2, 2013·5 cites·19 claims
- 0378US8213251B2Semiconductor memory device and method for driving the sameYUN TAE-SIK·Filed 2010·Granted Jul 3, 2012·6 cites·12 claims
- 0473US8553478B2Semiconductor integrated circuit and control method thereofYUN TAE SIK·Filed 2011·Granted Oct 8, 2013·3 cites·4 claims
- 0572US8300496B2Semiconductor memory apparatus and test method thereofYUN TAE SIK·Filed 2010·Granted Oct 30, 2012·4 cites·41 claims
- 0666US8964449B2Semiconductor memory deviceYUN TAE SIK·Filed 2012·Granted Feb 24, 2015·3 cites·8 claims
- 0763US9252129B2Semiconductor apparatusYUN TAE SIK·Filed 2012·Granted Feb 2, 2016·1 cites·15 claims
- 0863US8829933B2Semiconductor apparatus and probe test method thereofYUN TAE SIK·Filed 2010·Granted Sep 9, 2014·1 cites·17 claims
- 0961US8339872B2Semiconductor memory apparatus and method of driving bit-line sense amplifierYUN TAE-SIK·Filed 2009·Granted Dec 25, 2012·4 cites·6 claims
- 1060US8238179B2Device and method for generating test mode signalYUN TAE SIK·Filed 2010·Granted Aug 7, 2012·3 cites·26 claims
- 1158US8248096B2Test mode signal generating deviceYUN TAE SIK·Filed 2009·Granted Aug 21, 2012·2 cites·16 claims
- 1254US9360520B2Test mode control circuit of semiconductor apparatus and control method thereofYUN TAE SIK·Filed 2011·Granted Jun 7, 2016·1 cites·20 claims
- 1353US8867282B2Semiconductor apparatus with open bit line structureYUN TAE SIK·Filed 2011·Granted Oct 21, 2014·1 cites·9 claims
- 1453US8687450B2Semiconductor deviceYUN TAE SIK·Filed 2012·Granted Apr 1, 2014·1 cites·20 claims
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