Assignee
ZEHNTEL INC
US·13 granted patents·515 citations·filing 1974–1988
Top patents by PatentIndex Score
13 records- 0191US4216539AIn-circuit digital testerZEHNTEL INC·Filed 1978·Granted Aug 5, 1980·81 cites·60 claims
- 0291US4070565AProgrammable tester method and apparatusZEHNTEL INC·Filed 1976·Granted Jan 24, 1978·97 cites·23 claims
- 0387US3931506AProgrammable testerZEHNTEL INC·Filed 1974·Granted Jan 6, 1976·43 cites·25 claims
- 0485US4500993AIn-circuit digital tester for testing microprocessor boardsZEHNTEL INC·Filed 1982·Granted Feb 19, 1985·51 cites·24 claims
- 0585US4339819AProgrammable sequence generator for in-circuit digital testingZEHNTEL INC·Filed 1980·Granted Jul 13, 1982·50 cites·24 claims
- 0683US4439858ADigital in-circuit testerZEHNTEL INC·Filed 1981·Granted Mar 27, 1984·75 cites·7 claims
- 0765US3943439ACapacitor test apparatus and methodZEHNTEL INC·Filed 1974·Granted Mar 9, 1976·13 cites·14 claims
- 0864US4870354AApparatus for contacting a printed circuit board with an array of test probesZEHNTEL INC·Filed 1988·Granted Sep 26, 1989·31 cites·11 claims
- 0960US4593804AApparatus for guiding a circuit board onto a testing location on a test fixtureZEHNTEL INC·Filed 1985·Granted Jun 10, 1986·28 cites·6 claims
- 1056US4573009APrinted circuit board test fixture with flexion means for providing registration between the test probes and the circuit boardZEHNTEL INC·Filed 1983·Granted Feb 25, 1986·16 cites·15 claims
- 1149US4791359AMethod of detecting possibly electrically-open connections between circuit nodes and pins connected to those nodesZEHNTEL INC·Filed 1987·Granted Dec 13, 1988·15 cites·13 claims
- 1245US4967147ACircuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assembliesZEHNTEL INC·Filed 1988·Granted Oct 30, 1990·12 cites·20 claims
- 1322US4856001ADigital in-circuit tester having channel-memory earse-preventerZEHNTEL INC·Filed 1987·Granted Aug 8, 1989·3 cites·4 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →