Assignee
ZEISS IND MESSTECHNIK GMBH
DE·44 granted patents·5 pending applications·499 citations·filing 2002–2014
Top patents by PatentIndex Score
49 records- 0196US7296364B2Sensor module for a probe head of a tactile coordinated measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2007·Granted Nov 20, 2007·103 cites·20 claims
- 0292US6971183B2Probe head for coordinate measuring machinesZEISS IND MESSTECHNIK GMBH·Filed 2004·Granted Dec 6, 2005·55 cites·18 claims
- 0391US7918033B2Method for correcting the measured values of a coordinate measuring machine, and coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2010·Granted Apr 5, 2011·14 cites·10 claims
- 0491US6789327B2Touch probe with deflection measurement and inspection opticsZEISS IND MESSTECHNIK GMBH·Filed 2003·Granted Sep 14, 2004·71 cites·17 claims
- 0588US8365426B2Coordinate measuring machine for determining spatial coordinates on a measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2011·Granted Feb 5, 2013·10 cites·18 claims
- 0686US9383198B2Method and device for reducing errors in a turning device during the determination of coordinates of a workpiece or during the machining of a workpieceZEISS IND MESSTECHNIK GMBH·Filed 2013·Granted Jul 5, 2016·8 cites·8 claims
- 0786US8950078B2Apparatus with internal optical referenceZEISS IND MESSTECHNIK GMBH·Filed 2013·Granted Feb 10, 2015·8 cites·20 claims
- 0886US7714304B2Computed tomography measuring arrangement and methodZEISS IND MESSTECHNIK GMBH·Filed 2006·Granted May 11, 2010·18 cites·15 claims
- 0985US9234736B2Sensor assembly for determining a spatial position of a first part relative to a second partZEISS IND MESSTECHNIK GMBH·Filed 2013·Granted Jan 12, 2016·6 cites·16 claims
- 1084US9046335B2Method for measuring the coordinates of workpieces on a coordinate-measuring apparatusZEISS IND MESSTECHNIK GMBH·Filed 2012·Granted Jun 2, 2015·8 cites·24 claims
- 1184US8823930B2Apparatus and method for inspecting an objectZEISS IND MESSTECHNIK GMBH·Filed 2013·Granted Sep 2, 2014·5 cites·18 claims
- 1284US7685726B2Method for probing a workpiece using a coordinate measuring machine and coordinate measuring machinesZEISS IND MESSTECHNIK GMBH·Filed 2006·Granted Mar 30, 2010·18 cites·38 claims
- 1384US7599813B2Method and machine for determining a space coordinate of a measurement point on a measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2007·Granted Oct 6, 2009·15 cites·19 claims
- 1477US7337551B2Probe head for a coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2005·Granted Mar 4, 2008·10 cites·21 claims
- 1577US7246448B2Method for calibrating a probeZEISS IND MESSTECHNIK GMBH·Filed 2005·Granted Jul 24, 2007·10 cites·21 claims
- 1676US7228642B2Probe for a coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2006·Granted Jun 12, 2007·13 cites·20 claims
- 1775US7284337B2Probe head for a coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2005·Granted Oct 23, 2007·9 cites·11 claims
- 1874US7752766B2Method and apparatus for determining spatial coordinates at a multiplicity of measurement pointsZEISS IND MESSTECHNIK GMBH·Filed 2009·Granted Jul 13, 2010·8 cites·18 claims
- 1974US7698829B2Device for determining a measureable variable on a measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2008·Granted Apr 20, 2010·11 cites·20 claims
- 2073US7627957B2Coordinate measuring machine and method for operating a coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2008·Granted Dec 8, 2009·8 cites·15 claims
- 2172US9383181B2Method for coupling two system components of a measuring device, in particular a coordinate measuring deviceZEISS IND MESSTECHNIK GMBH·Filed 2014·Granted Jul 5, 2016·3 cites·20 claims
- 2272US9383190B1Measuring apparatus and method for determining dimensional characteristics of a measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2014·Granted Jul 5, 2016·3 cites·16 claims
- 2371US9080845B2Method and device for detecting the coupling of parts to a machineZEISS IND MESSTECHNIK GMBH·Filed 2013·Granted Jul 14, 2015·2 cites·8 claims
- 2471US7277188B2Systems and methods for implementing an interaction between a laser shaped as a line beam and a film deposited on a substrateZEISS IND MESSTECHNIK GMBH·Filed 2005·Granted Oct 2, 2007·7 cites·16 claims
- 2569US7594339B2Sensor module for a probe of a tactile coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2008·Granted Sep 29, 2009·6 cites·24 claims
- 2669US7194378B2Coordinate measuring apparatus and method for measuring a workpieceZEISS IND MESSTECHNIK GMBH·Filed 2005·Granted Mar 20, 2007·9 cites·20 claims
- 2767US9140532B2Measuring head for a coordinate measuring machine for determining spatial coordinates on a measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2013·Granted Sep 22, 2015·2 cites·18 claims
- 2867US7792653B2Correction of interpolation errors of a machine, such as a coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2008·Granted Sep 7, 2010·5 cites·12 claims
- 2967US7539595B2Method for determining the coordinates of a workpieceZEISS IND MESSTECHNIK GMBH·Filed 2005·Granted May 26, 2009·6 cites·20 claims
- 3066US9188428B2Coordinate measuring machine with selectively active white light sensorZEISS IND MESSTECHNIK GMBH·Filed 2013·Granted Nov 17, 2015·2 cites·17 claims
- 3165US7644507B2Method for scanning a surface with the aid of a coordinate measuring machine and coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2008·Granted Jan 12, 2010·6 cites·18 claims
- 3265US7610162B2Method and machine for determining a space coordinate of a measurement point on a measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2007·Granted Oct 27, 2009·5 cites·15 claims
- 3364US9261344B2Probe head for a coordinate measuring machine for determining spatial coordinates on a measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2012·Granted Feb 16, 2016·2 cites·24 claims
- 3464US8045806B2Method and device for identifying material boundaries of a test objectZEISS IND MESSTECHNIK GMBH·Filed 2007·Granted Oct 25, 2011·5 cites·13 claims
- 3561US7142999B2Method and device for correcting guiding errors in a coordinate measuring machineZEISS IND MESSTECHNIK GMBH·Filed 2004·Granted Nov 28, 2006·10 cites·32 claims
- 3660US7734438B2Method for determining correction values for correcting positional measurement errors in a machine having at least one translational axis of movementZEISS IND MESSTECHNIK GMBH·Filed 2007·Granted Jun 8, 2010·3 cites·17 claims
- 3758US7788820B2Method and device for contacting a surface point on a workpieceZEISS IND MESSTECHNIK GMBH·Filed 2008·Granted Sep 7, 2010·3 cites·14 claims
- 3853US7316075B2Coordinate measuring machine for metrological determination of a coordinate on a test objectZEISS IND MESSTECHNIK GMBH·Filed 2006·Granted Jan 8, 2008·2 cites·19 claims
- 3951US7543394B2Exchanging deviceZEISS IND MESSTECHNIK GMBH·Filed 2008·Granted Jun 9, 2009·4 cites·22 claims
- 4050US2010294911A1Support Body for Supporting Loads in a Vibration-Damping Fashion, in Particular for Supporting a Coordinate Measuring MachineZEISS IND MESSTECHNIK GMBH·Filed 2008·Application pending·0 cites
- 4146US7188432B2Correction of the temperature error during a measurement conducted by a coordinate measuring deviceZEISS IND MESSTECHNIK GMBH·Filed 2002·Granted Mar 13, 2007·4 cites·4 claims
- 4246US2014043469A1Chromatic sensor and methodZEISS IND MESSTECHNIK GMBH·Filed 2013·Application pending·0 cites
- 4346US2010118027A1Method and measuring arrangement for producing three-dimensional images of measuring objects by means of invasive radiationZEISS IND MESSTECHNIK GMBH·Filed 2008·Application pending·0 cites
- 4445US2014043464A1Coordinate measuring machine for determining spatial coordinates on a measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2013·Application pending·0 cites
- 4543US2014043610A1Apparatus for inspecting a measurement object with triangulation sensorZEISS IND MESSTECHNIK GMBH·Filed 2013·Application pending·0 cites
- 4640US7996180B2Method and device for determining geometric data of a conical measurement objectZEISS IND MESSTECHNIK GMBH·Filed 2009·Granted Aug 9, 2011·0 cites·13 claims
- 4740US7771118B2Method and configuration for examining a measurement object by way of invasive radiationZEISS IND MESSTECHNIK GMBH·Filed 2006·Granted Aug 10, 2010·0 cites·14 claims
- 4827USD596516SProbe change magazineZEISS IND MESSTECHNIK GMBH·Filed 2007·Granted Jul 21, 2009·0 cites·1 claims
- 4923USD601910STesting baseZEISS IND MESSTECHNIK GMBH·Filed 2008·Granted Oct 13, 2009·2 cites·1 claims
Join the waitlist — get patent alerts
Get an alert when ZEISS IND MESSTECHNIK GMBH files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →