Assignee
ZHONGKE JINGYUAN ELECTRON LTD
CN·4 granted patents·0 citations·filing 2018–2021
Top patents by PatentIndex Score
4 records- 0157US10789704B2Abnormality detection for periodic patternsZHONGKE JINGYUAN ELECTRON LTD·Filed 2019·Granted Sep 29, 2020·0 cites·20 claims
- 0248US10582099B2Sample height measurement using digital gratingZHONGKE JINGYUAN ELECTRON LTD·Filed 2018·Granted Mar 3, 2020·0 cites·20 claims
- 0347US11908657B2Scanning electron microscope device and electron beam inspection apparatusZHONGKE JINGYUAN ELECTRON LTD·Filed 2021·Granted Feb 20, 2024·0 cites·18 claims
- 0442US10553393B2Laser-assisted electron-beam inspection for semiconductor devicesZHONGKE JINGYUAN ELECTRON LTD·Filed 2018·Granted Feb 4, 2020·0 cites·17 claims
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