Assignee
ZHOU BAOSUO
US·5 granted patents·79 citations·filing 2006–2012
Top patents by PatentIndex Score
5 records- 0196US8338304B2Methods to reduce the critical dimension of semiconductor devices and related semiconductor devicesZHOU BAOSUO·Filed 2010·Granted Dec 25, 2012·27 cites·9 claims
- 0295US8852851B2Pitch reduction technology using alternating spacer depositions during the formation of a semiconductor device and systems including sameZHOU BAOSUO·Filed 2006·Granted Oct 7, 2014·23 cites·10 claims
- 0394US8836083B2Methods to reduce the critical dimension of semiconductor devices and related semiconductor devicesZHOU BAOSUO·Filed 2012·Granted Sep 16, 2014·15 cites·21 claims
- 0491US8324107B2Method for forming high density patternsZHOU BAOSUO·Filed 2010·Granted Dec 4, 2012·9 cites·19 claims
- 0576US9330934B2Methods of forming patterns on substratesZHOU BAOSUO·Filed 2009·Granted May 3, 2016·5 cites·47 claims
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