Assignee
ZJAJO AMIR
NL·3 granted patents·58 citations·filing 2008–2009
Top patents by PatentIndex Score
3 records- 0190US8310265B2IC testing methods and apparatusZJAJO AMIR·Filed 2008·Granted Nov 13, 2012·48 cites·14 claims
- 0275US8122423B2Analog circuit testing and test pattern generationZJAJO AMIR·Filed 2008·Granted Feb 21, 2012·10 cites·11 claims
- 0337US8497792B2Signal generation method and apparatus and test method and system using the sameZJAJO AMIR·Filed 2009·Granted Jul 30, 2013·0 cites·20 claims
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