Inventor · disambiguated record

Richard C. Blish Ii

Also filed as: BLISH II RICHARD C

1 granted patent·5 citations·filing 2002–2002

26Inventor score

Technology areasG21K

Files withADVANCED MICRO DEVICES INC1

Top patents by PatentIndex Score

1 record

0154US6751294B1Prevention of parametic or functional changes to silicon semiconductor device properties during x-ray inspectionADVANCED MICRO DEVICES INC·Filed 2002·Granted Jun 15, 2004·5 cites·15 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →