Inventor · disambiguated record
Andrew W. Lai
Also filed as: LAI ANDREW W · LAI ANDREW WING-LEUNG
15 granted patents·207 citations·filing 2001–2010
94Inventor score
Top patents by PatentIndex Score
15 records- 0193US8327201B1Parallel testing of an integrated circuit that includes multiple diesLAI ANDREW W·Filed 2010·Granted Dec 4, 2012·23 cites·20 claims
- 0292US8633722B1Method and circuit for testing accuracy of delay circuitryLAI ANDREW W·Filed 2010·Granted Jan 21, 2014·22 cites·17 claims
- 0386US6944836B1Structures and methods for testing programmable logic devices having mixed-fabric architecturesXILINX INC·Filed 2002·Granted Sep 13, 2005·29 cites·6 claims
- 0482US7739564B1Testing an integrated circuit using dedicated function pinsXILINX INC·Filed 2007·Granted Jun 15, 2010·12 cites·20 claims
- 0582US7620862B1Method of and system for testing an integrated circuitXILINX INC·Filed 2005·Granted Nov 17, 2009·12 cites·19 claims
- 0681US7187199B1Structures and methods for testing programmable logic devices having mixed-fabric architecturesXILINX INC·Filed 2005·Granted Mar 6, 2007·10 cites·20 claims
- 0780US7007250B1Application-specific methods useful for testing look up tables in programmable logic devicesXILINX INC·Filed 2003·Granted Feb 28, 2006·20 cites·19 claims
- 0875US7583102B1Testing of input/output devices of an integrated circuitXILINX INC·Filed 2006·Granted Sep 1, 2009·8 cites·20 claims
- 0974US6876218B1Method for accurate output voltage testingXILINX INC·Filed 2003·Granted Apr 5, 2005·18 cites·21 claims
- 1071US7685486B1Testing of an embedded multiplexer having a plurality of inputsXILINX INC·Filed 2007·Granted Mar 23, 2010·6 cites·15 claims
- 1171US6732309B1Method for testing faults in a programmable logic deviceXILINX INC·Filed 2001·Granted May 4, 2004·15 cites·5 claims
- 1270US7219314B1Application-specific methods for testing molectronic or nanoscale devicesXILINX INC·Filed 2004·Granted May 15, 2007·14 cites·17 claims
- 1367US6944809B2Methods of resource optimization in programmable logic devices to reduce test timeXILINX INC·Filed 2002·Granted Sep 13, 2005·13 cites·19 claims
- 1464US7724030B1Method and apparatus for providing a feedback path for an output signalXILINX INC·Filed 2007·Granted May 25, 2010·4 cites·18 claims
- 1549US7728604B1Testing differential signal standards using device under test's built in resistorsXILINX INC·Filed 2008·Granted Jun 1, 2010·1 cites·16 claims
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