Inventor
JUANG SHAUH-TEH
US17 patents
⚠️ This page may combine multiple inventors who share the name “JUANG SHAUH-TEH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
DMO SYSTEMS LTD
4 patentsUS9547745B1Jan 17, 2017
System and method for discovering unknown problematic patterns in chip design layout for semiconductor manufacturing
DMO SYSTEMS LTD7 citations80
US10365617B2Jul 30, 2019
Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow
DMO SYSTEMS LTD4 citations69
US8938695B1Jan 20, 2015
Signature analytics for improving lithographic process of manufacturing semiconductor devices
DMO SYSTEMS LTD6 citations69
US9142014B2Sep 22, 2015
System and method for identifying systematic defects in wafer inspection using hierarchical grouping and filtering
DMO SYSTEMS LTD1 citations48
APPLIED MATERIALS INC
4 patentsUS11120182B2Sep 14, 2021
Methodology of incorporating wafer physical measurement with digital simulation for improving semiconductor device fabrication
APPLIED MATERIALS INC1 citations60
US12259719B2Mar 25, 2025
Methods and mechanisms for preventing fluctuation in machine-learning model performance
APPLIED MATERIALS INC0 citations58
US12236077B2Feb 25, 2025
Methods and mechanisms for generating virtual knobs for model performance tuning
APPLIED MATERIALS INC0 citations56
US10754309B2Aug 25, 2020
Auto defect screening using adaptive machine learning in semiconductor device manufacturing flow
APPLIED MATERIALS INC0 citations50
KLA TENCOR
3 patentsUS6529621B1Mar 4, 2003
Mechanisms for making and inspecting reticles
KLA TENCOR135 citations98
US6748103B2Jun 8, 2004
Mechanisms for making and inspecting reticles
KLA TENCOR45 citations95
US6516085B1Feb 4, 2003
Apparatus and methods for collecting global data during a reticle inspection
KLA TENCOR30 citations92