Inventor
NURANI RAMAN K
IN11 patents
⚠️ This page may combine multiple inventors who share the name “NURANI RAMAN K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
10 patentsUS10579041B2Mar 3, 2020
Semiconductor process control method
APPLIED MATERIALS INC7 citations81
US10481199B2Nov 19, 2019
Data analytics and computational analytics for semiconductor process control
APPLIED MATERIALS INC2 citations70
US11842910B2Dec 12, 2023
Detecting outliers at a manufacturing system using machine learning
APPLIED MATERIALS INC2 citations61
US11187992B2Nov 30, 2021
Predictive modeling of metrology in semiconductor processes
APPLIED MATERIALS INC0 citations60
US10579769B2Mar 3, 2020
Using design proximity index and effect-to-design proximity ratio to control semiconductor processes and achieve enhanced yield
APPLIED MATERIALS INC1 citations60
US12468873B2Nov 11, 2025
Systems and methods for predicting film thickness using virtual metrology
APPLIED MATERIALS INC0 citations54
US11989495B2May 21, 2024
Systems and methods for predicting film thickness using virtual metrology
APPLIED MATERIALS INC0 citations54
US11862520B2Jan 2, 2024
Systems and methods for predicting film thickness of individual layers using virtual metrology
APPLIED MATERIALS INC0 citations47
US11088039B2Aug 10, 2021
Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data
APPLIED MATERIALS INC0 citations46
US10614262B2Apr 7, 2020
Method of predicting areas of vulnerable yield in a semiconductor substrate
APPLIED MATERIALS INC0 citations35