Inventor
RAGAVAN KOUSHIK
IN6 patents
Patents
6 patentsUS10579041B2Mar 3, 2020
Semiconductor process control method
APPLIED MATERIALS INC7 citations81
US10481199B2Nov 19, 2019
Data analytics and computational analytics for semiconductor process control
APPLIED MATERIALS INC2 citations70
US11187992B2Nov 30, 2021
Predictive modeling of metrology in semiconductor processes
APPLIED MATERIALS INC0 citations60
US10579769B2Mar 3, 2020
Using design proximity index and effect-to-design proximity ratio to control semiconductor processes and achieve enhanced yield
APPLIED MATERIALS INC1 citations60
US11088039B2Aug 10, 2021
Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data
APPLIED MATERIALS INC0 citations46
US10614262B2Apr 7, 2020
Method of predicting areas of vulnerable yield in a semiconductor substrate
APPLIED MATERIALS INC0 citations35