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Inventor
AUJLA KARANPREET
US
2 patents
Patents
2 patents
US11088039B2
Aug 10, 2021
Data management and mining to correlate wafer alignment, design, defect, process, tool, and metrology data
APPLIED MATERIALS INC
0 citations
46
US10614262B2
Apr 7, 2020
Method of predicting areas of vulnerable yield in a semiconductor substrate
APPLIED MATERIALS INC
0 citations
35