Inventor
RUDIN SERGEY
US3 patents
Patents
3 patentsUS11675002B2Jun 13, 2023
Terahertz plasmonics for testing very large-scale integrated circuits under bias
US GOV SEC ARMY1 citations68
US10890618B2Jan 12, 2021
Terahertz plasmonics for testing very large-scale integrated circuits under bias
US GOV SEC ARMY1 citations68
US12360159B2Jul 15, 2025
Terahertz plasmonics for testing very large-scale integrated circuits under bias
US GOV SEC ARMY0 citations57