Inventor
IKAWA Yusuke
JP12 patents
⚠️ This page may combine multiple inventors who share the name “IKAWA Yusuke”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SANDISK TECHNOLOGIES LLC
7 patentsUS9711530B1Jul 18, 2017
Locally-trap-characteristic-enhanced charge trap layer for three-dimensional memory structures
SANDISK TECHNOLOGIES LLC23 citations92
US10074661B2Sep 11, 2018
Three-dimensional junction memory device and method reading thereof using hole current detection
SANDISK TECHNOLOGIES LLC12 citations83
US10971514B2Apr 6, 2021
Multi-tier three-dimensional memory device with dielectric support pillars and methods for making the same
SANDISK TECHNOLOGIES LLC8 citations82
US9812463B2Nov 7, 2017
Three-dimensional memory device containing vertically isolated charge storage regions and method of making thereof
SANDISK TECHNOLOGIES LLC6 citations72
US12009269B2Jun 11, 2024
Virtual metrology for feature profile prediction in the production of memory devices
SANDISK TECHNOLOGIES LLC4 citations70
US12105137B2Oct 1, 2024
Virtual quality control interpolation and process feedback in the production of memory devices
SANDISK TECHNOLOGIES LLC0 citations49
US12135542B2Nov 5, 2024
Modelling and prediction of virtual inline quality control in the production of memory devices
SANDISK TECHNOLOGIES LLC0 citations46
SANDISK TECHNOLOGIES INC
3 patentsUS9589839B1Mar 7, 2017
Method of reducing control gate electrode curvature in three-dimensional memory devices
SANDISK TECHNOLOGIES INC19 citations83
US12555643B2Feb 17, 2026
Dummy memory hole defect detection
SANDISK TECHNOLOGIES INC0 citations49
US12555213B2Feb 17, 2026
Modelling and prediction system with auto machine learning in the production of memory devices
SANDISK TECHNOLOGIES INC0 citations46