Inventor
BISSEY LUCIEN J
US26 patents
⚠️ This page may combine multiple inventors who share the name “BISSEY LUCIEN J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
24 patentsUS6794699B2Sep 21, 2004
Annular gate and technique for fabricating an annular gate
MICRON TECHNOLOGY INC172 citations99
US7205598B2Apr 17, 2007
Random access memory device utilizing a vertically oriented select transistor
MICRON TECHNOLOGY INC60 citations98
US6504236B2Jan 7, 2003
Semiconductor die assembly having leadframe decoupling characters and method
MICRON TECHNOLOGY INC37 citations96
US6184574B1Feb 6, 2001
Multi-capacitance lead frame decoupling device
MICRON TECHNOLOGY INC63 citations96
US6054754AApr 25, 2000
Multi-capacitance lead frame decoupling device
MICRON TECHNOLOGY INC69 citations96
US7777264B2Aug 17, 2010
Random access memory device utilizing a vertically oriented select transistor
MICRON TECHNOLOGY INC15 citations92
US6841438B2Jan 11, 2005
Annular gate and technique for fabricating an annular gate
MICRON TECHNOLOGY INC27 citations92
US6781219B2Aug 24, 2004
Semiconductor die assembly having leadframe decoupling characters
MICRON TECHNOLOGY INC22 citations92
US6356474B1Mar 12, 2002
Efficient open-array memory device architecture and method
MICRON TECHNOLOGY INC31 citations92
US6310388B1Oct 30, 2001
Semiconductor die assembly having leadframe decoupling characters
MICRON TECHNOLOGY INC21 citations92
US6169696B1Jan 2, 2001
Method and apparatus for stress testing a semiconductor memory
MICRON TECHNOLOGY INC21 citations92
US7276754B2Oct 2, 2007
Annular gate and technique for fabricating an annular gate
MICRON TECHNOLOGY INC10 citations84
US5848017ADec 8, 1998
Method and apparatus for stress testing a semiconductor memory
MICRON TECHNOLOGY INC15 citations82
US6951789B2Oct 4, 2005
Method of fabricating a random access memory device utilizing a vertically oriented select transistor
MICRON TECHNOLOGY INC11 citations74
US5999467ADec 7, 1999
Method and apparatus for stress testing a semiconductor memory
MICRON TECHNOLOGY INC10 citations74
US6784043B2Aug 31, 2004
Methods for forming aligned fuses disposed in an integrated circuit
MICRON TECHNOLOGY INC7 citations71
US6522595B2Feb 18, 2003
Methods for forming and programming aligned fuses disposed in an integrated circuit
MICRON TECHNOLOGY INC5 citations71
US6172929B1Jan 9, 2001
Integrated circuit having aligned fuses and methods for forming and programming the fuses
MICRON TECHNOLOGY INC14 citations71
US7432197B2Oct 7, 2008
Methods of patterning photoresist, and methods of forming semiconductor constructions
MICRON TECHNOLOGY INC4 citations63
US11822489B2Nov 21, 2023
Data integrity protection for relocating data in a memory system
MICRON TECHNOLOGY INC0 citations52
US7964503B2Jun 21, 2011
Methods of patterning photoresist, and methods of forming semiconductor constructions
MICRON TECHNOLOGY INC0 citations52
US6235622B1May 22, 2001
Method and apparatus for isolating a conductive region from a substrate during manufacture of an integrated circuit and connected to the substrate after manufacture
MICRON TECHNOLOGY INC0 citations51
US6137119AOct 24, 2000
Apparatus for isolating a conductive region from a substrate during manufacture of an integrated circuit and connecting the conductive region to the substrate after manufacture
MICRON TECHNOLOGY INC0 citations51
US6642084B2Nov 4, 2003
Methods for forming aligned fuses disposed in an integrated circuit
MICRON TECHNOLOGY INC1 citations49