Inventor

KANO MUTSUMI

JP2 patents

⚠️ This page may combine multiple inventors who share the name “KANO MUTSUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI DENKI KABSUHIKI KAI

1 patent

US6646455B2Nov 11, 2003

Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter

MITSUBISHI DENKI KABSUHIKI KAI52 citations94

MITSUBISHI ELECTRIC CORP

1 patent

US6888344B2May 3, 2005

Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter

MITSUBISHI ELECTRIC CORP24 citations91