Inventor

CHUMAKOV DMYTRO

DE19 patents

⚠️ This page may combine multiple inventors who share the name “CHUMAKOV DMYTRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHUMAKOV DMYTRO

CHUMAKOV DMYTRO

Stress reduction in chip packaging by a stress compensation region formed around the chip

Test structure for ILD void testing and contact resistance measurement in a semiconductor device

Shrinkage of contact elements and vias in a semiconductor device by incorporating additional tapering material

Integrated circuits having place-efficient capacitors and methods for fabricating the same

In-situ measurement of feature dimensions

Chip package including multiple sections for reducing chip package interaction

Method and system for extracting samples after patterning of microstructure devices

Semiconductor device comprising a buried capacitor formed in the contact level

Integrated circuits having place-efficient capacitors and methods for fabricating the same

Dopant marker for precise recess control

Semiconductor device comprising a capacitor formed in the contact level

Dopant marker for precise recess control

Shrinkage of critical dimensions in a semiconductor device by selective growth of a mask material

DRAM cell based on conductive nanochannel plate

Mask-based silicidation for FEOL defectivity reduction and yield boost

Integrated circuit fabrication methods utilizing embedded hardmask layers for high resolution patterning

ADVANCED MICRO DEVICES INC

Method and apparatus for determining surface characteristics by using SPM techniques with acoustic excitation and real-time digitizing

GLOBALFOUNDRIES INC

DRAM cell based on conductive nanochannel plate

HETZER PETRA

Method and system for particles analysis in microstructure devices by isolating particles