Inventor
LABONTE ANDRE
US22 patents
⚠️ This page may combine multiple inventors who share the name “LABONTE ANDRE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
GLOBALFOUNDRIES INC
21 patentsUS10026824B1Jul 17, 2018
Air-gap gate sidewall spacer and method
GLOBALFOUNDRIES INC53 citations97
US10243053B1Mar 26, 2019
Gate contact structure positioned above an active region of a transistor device
GLOBALFOUNDRIES INC33 citations94
US9929048B1Mar 27, 2018
Middle of the line (MOL) contacts with two-dimensional self-alignment
GLOBALFOUNDRIES INC22 citations94
US9824921B1Nov 21, 2017
Method and apparatus for placing a gate contact inside a semiconductor active region having high-k dielectric gate caps
GLOBALFOUNDRIES INC32 citations94
US9691897B2Jun 27, 2017
Three-dimensional semiconductor transistor with gate contact in active region
GLOBALFOUNDRIES INC22 citations94
US9490317B1Nov 8, 2016
Gate contact structure having gate contact layer
GLOBALFOUNDRIES INC29 citations94
US9324656B1Apr 26, 2016
Methods of forming contacts on semiconductor devices and the resulting devices
GLOBALFOUNDRIES INC18 citations92
US10566201B1Feb 18, 2020
Gate cut method after source/drain metallization
GLOBALFOUNDRIES INC6 citations84
US9941278B2Apr 10, 2018
Method and apparatus for placing a gate contact inside an active region of a semiconductor
GLOBALFOUNDRIES INC13 citations84
US9780178B2Oct 3, 2017
Methods of forming a gate contact above an active region of a semiconductor device
GLOBALFOUNDRIES INC17 citations84
US9502286B2Nov 22, 2016
Methods of forming self-aligned contact structures on semiconductor devices and the resulting devices
GLOBALFOUNDRIES INC14 citations84
US9478662B2Oct 25, 2016
Gate and source/drain contact structures for a semiconductor device
GLOBALFOUNDRIES INC6 citations84
US9455254B2Sep 27, 2016
Methods of forming a combined gate and source/drain contact structure and the resulting device
GLOBALFOUNDRIES INC10 citations84
US10249728B2Apr 2, 2019
Air-gap gate sidewall spacer and method
GLOBALFOUNDRIES INC3 citations73
US10014215B2Jul 3, 2018
Method and apparatus for placing a gate contact inside a semiconductor active region having high-k dielectric gate caps
GLOBALFOUNDRIES INC3 citations73
US10211100B2Feb 19, 2019
Methods of forming an air gap adjacent a gate of a transistor and a gate contact above the active region of the transistor
GLOBALFOUNDRIES INC2 citations72
US10879073B2Dec 29, 2020
Insulating gate separation structure for transistor devices
GLOBALFOUNDRIES INC1 citations63
US10770585B2Sep 8, 2020
Self-aligned buried contact for vertical field-effect transistor and method of production thereof
GLOBALFOUNDRIES INC1 citations62
US10468300B2Nov 5, 2019
Contacting source and drain of a transistor device
GLOBALFOUNDRIES INC1 citations62
US10283408B2May 7, 2019
Middle of the line (MOL) contacts with two-dimensional self-alignment
GLOBALFOUNDRIES INC0 citations52
US9460963B2Oct 4, 2016
Self-aligned contacts and methods of fabrication
GLOBALFOUNDRIES INC1 citations51