Inventor
INABA KATSUHIKO
JP12 patents
⚠️ This page may combine multiple inventors who share the name “INABA KATSUHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RIGAKU DENKI CO LTD
10 patentsUS6999557B2Feb 14, 2006
Method of setting measuring range of reciprocal-space mapping
RIGAKU DENKI CO LTD13 citations83
US6970532B2Nov 29, 2005
Method and apparatus for measuring thin film, and thin film deposition system
RIGAKU DENKI CO LTD13 citations83
US7684543B2Mar 23, 2010
X-ray beam conditioning device and X-ray analysis apparatus
RIGAKU DENKI CO LTD10 citations82
US9218315B2Dec 22, 2015
X-ray analysis apparatus
RIGAKU DENKI CO LTD4 citations70
US7680246B2Mar 16, 2010
Method and device for judging polarity of single crystal sample
RIGAKU DENKI CO LTD2 citations61
US11788974B2Oct 17, 2023
Control apparatus, system, method, and program
RIGAKU DENKI CO LTD1 citations60
US10585053B2Mar 10, 2020
X-ray diffractometer
RIGAKU DENKI CO LTD0 citations51
US10837923B2Nov 17, 2020
X-ray analysis device and method for optical axis alignment thereof
RIGAKU DENKI CO LTD0 citations50
US9086367B2Jul 21, 2015
X-ray intensity correction method and X-ray diffractometer
RIGAKU DENKI CO LTD1 citations50
US10444168B2Oct 15, 2019
Method and apparatus for measuring bowing of single-crystal substrate
RIGAKU DENKI CO LTD0 citations39