P

Inventor

LAUFER TIMO

DE20 patents
⚠️ This page may combine multiple inventors who share the name “LAUFER TIMO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ZEISS CARL SMT GMBH

14 patents
US10031423B2Jul 24, 2018

EUV exposure apparatus with reflective elements having reduced influence of temperature variation

ZEISS CARL SMT GMBH4 citations82
US9316929B2Apr 19, 2016

EUV exposure apparatus with reflective elements having reduced influence of temperature variation

ZEISS CARL SMT GMBH10 citations82
US11372341B2Jun 28, 2022

Method for temperature control of a component

ZEISS CARL SMT GMBH3 citations69
US11187989B2Nov 30, 2021

Method for determining properties of an EUV source

ZEISS CARL SMT GMBH1 citations62
US11022903B2Jun 1, 2021

Method for temperature control of a component

ZEISS CARL SMT GMBH1 citations59
US12140877B2Nov 12, 2024

Method for avoiding a degradation of an optical element, projection system, illumination system and projection exposure apparatus

ZEISS CARL SMT GMBH1 citations52
US9383328B2Jul 5, 2016

Lithography apparatus

ZEISS CARL SMT GMBH1 citations51
US10684551B2Jun 16, 2020

EUV exposure apparatus with reflective elements having reduced influence of temperature variation

ZEISS CARL SMT GMBH0 citations50
US10317802B2Jun 11, 2019

EUV exposure apparatus with reflective elements having reduced influence of temperature variation

ZEISS CARL SMT GMBH0 citations50
US9746778B2Aug 29, 2017

EUV exposure apparatus with reflective elements having reduced influence of temperature variation

ZEISS CARL SMT GMBH0 citations50
US12321105B2Jun 3, 2025

Projection exposure apparatus for semiconductor lithography

ZEISS CARL SMT GMBH0 citations49
US12321106B2Jun 3, 2025

Device for detecting a temperature, installation for producing an optical element and method for producing an optical element

ZEISS CARL SMT GMBH0 citations49
US9639007B2May 2, 2017

Optical arrangement in an optical system, in particular in a microlithographic projection exposure apparatus

ZEISS CARL SMT GMBH0 citations49
US10466598B2Nov 5, 2019

Projection exposure apparatus for semiconductor lithography with increased thermal robustness

ZEISS CARL SMT GMBH0 citations26

ZEISS CARL SMT AG

3 patents

EHM DIRK HEINRICH

1 patent

SCHOEPPACH ARMIN

1 patent

LAUFER TIMO

1 patent