Inventor

SAWADA HIDETAKA

JP21 patents

⚠️ This page may combine multiple inventors who share the name “SAWADA HIDETAKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAWADA HIDETAKA

JEOL LTD

Method of measuring aberrations and correcting aberrations using Ronchigram and electron microscope

Chromatic aberration corrector and electron microscope

Aberration correction system

Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimen

Multipole lens, aberration corrector, and electron microscope

Method for axial alignment of charged particle beam and charged particle beam system

Charged-particle beam system

Aberration correcting device and electron microscope

Liner tube and electron microscope

Spherical aberration corrector, method of spherical aberration correction, and charged particle beam instrument

Aberration corrector and electron microscope

SAWADA HIDETAKA

Chromatic aberration corrector for charged-particle beam system and correction method therefor

Two-stage dodecapole aberration corrector for charged-particle beam

Electron microscope

Method for axial alignment of charged particle beam and charged particle beam system

Spherical aberration corrector and method of spherical aberration correction

Scanning transmission electron microscope and method of aberration correction therefor

HITACHI SHIPBUILDING ENG CO

Apparatus for manufacturing ultra-pure water

Degreasing-cleaning method

SHIBATA NAOYA

Transmission electron microscope

UNIV TOKYO

Electron microscope and measurement method