Inventor
LOEWENSTERN KENNETH M
6 patents
Patents
6 patentsUS4146834AMar 27, 1979
Admittance measuring system for monitoring the condition of materials
DREXELBROOK CONTROLS52 citations92
US3993947ANov 23, 1976
Admittance measuring system for monitoring the condition of materials
DREXELBROOK CONTROLS19 citations81
US4232300ANov 4, 1980
Level measuring system using admittance sensing
DREXELBROOK CONTROLS28 citations79
US4511948AApr 16, 1985
Two layer probe
DREXELBROOK CONTROLS12 citations71
US4428026AJan 24, 1984
Two layer probe
DREXELBROOK CONTROLS14 citations71
US4301681ANov 24, 1981
Method of using capacitor probe with a semiconductive electrode
DREXELBROOK CONTROLS17 citations71