Inventor
SHIDLA DALE J
US14 patents
⚠️ This page may combine multiple inventors who share the name “SHIDLA DALE J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HEWLETT PACKARD DEVELOPMENT CO
12 patentsUS6985826B2Jan 10, 2006
System and method for testing a component in a computer system using voltage margining
HEWLETT PACKARD DEVELOPMENT CO22 citations92
US6895353B2May 17, 2005
Apparatus and method for monitoring high impedance failures in chip interconnects
HEWLETT PACKARD DEVELOPMENT CO19 citations92
US7418367B2Aug 26, 2008
System and method for testing a cell
HEWLETT PACKARD DEVELOPMENT CO17 citations83
US6995581B2Feb 7, 2006
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects
HEWLETT PACKARD DEVELOPMENT CO12 citations83
US6940288B2Sep 6, 2005
Apparatus and method for monitoring and predicting failures in system interconnect
HEWLETT PACKARD DEVELOPMENT CO13 citations83
US6879173B2Apr 12, 2005
Apparatus and method for detecting and rejecting high impedance failures in chip interconnects
HEWLETT PACKARD DEVELOPMENT CO12 citations83
US7797134B2Sep 14, 2010
System and method for testing a memory with an expansion card using DMA
HEWLETT PACKARD DEVELOPMENT CO2 citations62
US7487399B2Feb 3, 2009
System and method for testing a component in a computer system using frequency margining
HEWLETT PACKARD DEVELOPMENT CO2 citations62
US7350109B2Mar 25, 2008
System and method for testing a memory using DMA
HEWLETT PACKARD DEVELOPMENT CO4 citations62
US7246222B2Jul 17, 2007
Processor type determination based on reset vector characteristics
HEWLETT PACKARD DEVELOPMENT CO2 citations56
US7072788B2Jul 4, 2006
System and method for testing an interconnect in a computer system
HEWLETT PACKARD DEVELOPMENT CO0 citations51
US7469370B2Dec 23, 2008
Enabling multiple testing devices
HEWLETT PACKARD DEVELOPMENT CO0 citations47