Inventor

MIYAMOTO ATSUSHI

JP151 patents

⚠️ This page may combine multiple inventors who share the name “MIYAMOTO ATSUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MIYAMOTO ATSUSHI

HITACHI HIGH TECH CORP

Method of classifying defects using multiple inspection machines

Method and apparatus for observing a specimen

Method and apparatus for creating imaging recipe

Observation device and observation method

Scanning electron microscope and a method for imaging a specimen using the same

Method and apparatus for reviewing defects

Method and apparatus for observing a specimen

Method and apparatus for measuring shape of a specimen

Apparatus and method for classifying defects using multiple classification modules

Method and apparatus for semiconductor device production process monitoring and method and apparatus for estimating cross sectional shape of a pattern

Method and apparatus of reviewing defects on a semiconductor device

Defect classification using a logical equation for high stage classification

Method and apparatus for evaluating pattern shape of a semiconductor device

Method and apparatus for observing a specimen

Method and apparatus for measuring dimension of circuit pattern formed on substrate by using scanning electron microscope

Method and apparatus for measuring three-dimensional shape of specimen by using SEM

SONY CORP

Robot arm apparatus, robot arm control method, and program

Operation control device for leg-type mobile robot and operation control method, and robot device

Robot arm apparatus, robot arm control method, and program

Motion editing apparatus and method for robot device, and computer program

Motion editing apparatus and method for legged mobile robot and computer program

Control device, control method, and microscope device for operation

Robot arm apparatus, robot arm apparatus control method, and program

Robot arm apparatus and robot arm control method

Robot arm apparatus, robot arm apparatus control method, and program

Actuator and robot arm apparatus

Information processing apparatus, electronic apparatus, server, information processing program, and information processing method

Robot apparatus, method for controlling the same, and computer program

Robot apparatus, method for controlling the same, and computer program

Motion editing apparatus and motion editing method for robot, computer program and robot apparatus

Robot apparatus, method of controlling the same, and computer program

SONY OLYMPUS MEDICAL SOLUTIONS INC

Medical observation device

Medical robot arm apparatus, medical robot arm control system, medical robot arm control method, and program

Medical robot arm apparatus, medical robot arm control system, medical robot arm control method, and program

HITACHI PRINTING SOLUTIONS LTD

Printing system that positions web at accurate waiting position

Print system and registration control method at print start time of the print system

Method of setting a print start position in a continuous form printing system

HITACHI LTD

Method and apparatus for arranging recipe of scanning electron microscope and apparatus for evaluating shape of semiconductor device pattern

Method and its apparatus for classifying defects

NAKAHIRA KENJI

Scanning electron microscope and method for processing an image obtained by the scanning electron microscope

Scanning type charged particle beam microscope and an image processing method using the same

TOKYO OHKA KOGYO CO LTD

Cleaning liquid for lithography and method for resist pattern formation

Rinsing fluid for lithography

NEC CORP

Picture processing system and method

HITACHI KOKI KK

Printing system

NIKON CORP

Feature extraction element, feature extraction system, and determination apparatus

RICOH KK

Duplex printing system

SHISHIDO CHIE

Scanning electron microscope system and method for measuring dimensions of patterns formed on semiconductor device by using the system

MIYAMOTO ATSUSHI

Method and device for synthesizing panorama image using scanning charged-particle microscope

NISHIURA TOMOFUMI

Method and apparatus for inspecting defect of pattern formed on semiconductor device