Inventor
OLSON JOSEPH C
US117 patents
⚠️ This page may combine multiple inventors who share the name “OLSON JOSEPH C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
VARIAN SEMICONDUCTOR EQUIPMENT
24 patentsUS6777686B2Aug 17, 2004
Control system for indirectly heated cathode ion source
VARIAN SEMICONDUCTOR EQUIPMENT61 citations96
US6437350B1Aug 20, 2002
Methods and apparatus for adjusting beam parallelism in ion implanters
VARIAN SEMICONDUCTOR EQUIPMENT67 citations96
US6791094B1Sep 14, 2004
Method and apparatus for determining beam parallelism and direction
VARIAN SEMICONDUCTOR EQUIPMENT63 citations95
US6573518B1Jun 3, 2003
Bi mode ion implantation with non-parallel ion beams
VARIAN SEMICONDUCTOR EQUIPMENT23 citations93
US6075249AJun 13, 2000
Methods and apparatus for scanning and focusing an ion beam
VARIAN SEMICONDUCTOR EQUIPMENT27 citations93
US7138768B2Nov 21, 2006
Indirectly heated cathode ion source
VARIAN SEMICONDUCTOR EQUIPMENT49 citations89
US6403972B1Jun 11, 2002
Methods and apparatus for alignment of ion beam systems using beam current sensors
VARIAN SEMICONDUCTOR EQUIPMENT20 citations87
US8937004B2Jan 20, 2015
Apparatus and method for controllably implanting workpieces
VARIAN SEMICONDUCTOR EQUIPMENT5 citations84
US8354655B2Jan 15, 2013
Method and system for controlling critical dimension and roughness in resist features
VARIAN SEMICONDUCTOR EQUIPMENT7 citations84
US7868305B2Jan 11, 2011
Technique for ion beam angle spread control
VARIAN SEMICONDUCTOR EQUIPMENT8 citations84
US7166854B2Jan 23, 2007
Uniformity control multiple tilt axes, rotating wafer and variable scan velocity
VARIAN SEMICONDUCTOR EQUIPMENT17 citations84
US7655932B2Feb 2, 2010
Techniques for providing ion source feed materials
VARIAN SEMICONDUCTOR EQUIPMENT10 citations83
US7253423B2Aug 7, 2007
Technique for uniformity tuning in an ion implanter system
VARIAN SEMICONDUCTOR EQUIPMENT14 citations83
US7102139B2Sep 5, 2006
Source arc chamber for ion implanter having repeller electrode mounted to external insulator
VARIAN SEMICONDUCTOR EQUIPMENT14 citations83
US6710359B2Mar 23, 2004
Methods and apparatus for scanned beam uniformity adjustment in ion implanters
VARIAN SEMICONDUCTOR EQUIPMENT14 citations83
US7459704B2Dec 2, 2008
Ion source configuration for production of ionized clusters, ionized molecules and ionized mono-atoms
VARIAN SEMICONDUCTOR EQUIPMENT17 citations82
US7663125B2Feb 16, 2010
Ion beam current uniformity monitor, ion implanter and related method
VARIAN SEMICONDUCTOR EQUIPMENT8 citations81
US8853653B1Oct 7, 2014
Apparatus and techniques for controlling ion implantation uniformity
VARIAN SEMICONDUCTOR EQUIPMENT6 citations80
US7355188B2Apr 8, 2008
Technique for uniformity tuning in an ion implanter system
VARIAN SEMICONDUCTOR EQUIPMENT13 citations80
US7442944B2Oct 28, 2008
Ion beam implant current, spot width and position tuning
VARIAN SEMICONDUCTOR EQUIPMENT9 citations79
US7276847B2Oct 2, 2007
Cathode assembly for indirectly heated cathode ion source
VARIAN SEMICONDUCTOR EQUIPMENT14 citations79
US7161161B2Jan 9, 2007
Uniformity control using multiple fixed wafer orientations and variable scan velocity
VARIAN SEMICONDUCTOR EQUIPMENT7 citations74
US8884244B1Nov 11, 2014
Dual mode ion implanter
VARIAN SEMICONDUCTOR EQUIPMENT4 citations73
US7250617B2Jul 31, 2007
Ion beam neutral detection
VARIAN SEMICONDUCTOR EQUIPMENT7 citations73
APPLIED MATERIALS INC
21 patentsUS11247298B2Feb 15, 2022
Method of forming a plurality of gratings
APPLIED MATERIALS INC9 citations86
US10935799B2Mar 2, 2021
Optical component having depth modulated angled gratings and method of formation
APPLIED MATERIALS INC10 citations86
US10823888B1Nov 3, 2020
Methods of producing slanted gratings with variable etch depths
APPLIED MATERIALS INC15 citations86
US10302826B1May 28, 2019
Controlling etch angles by substrate rotation in angled etch tools
APPLIED MATERIALS INC15 citations86
US10775158B2Sep 15, 2020
System and method for detecting etch depth of angled surface relief gratings
APPLIED MATERIALS INC7 citations84
US9377692B2Jun 28, 2016
Electric/magnetic field guided acid diffusion
APPLIED MATERIALS INC18 citations83
US11670482B2Jun 6, 2023
Modulation of rolling k vectors of angled gratings
APPLIED MATERIALS INC1 citations73
US11587778B2Feb 21, 2023
Electrodynamic mass analysis with RF biased ion source
APPLIED MATERIALS INC2 citations73
US11512385B2Nov 29, 2022
Method of forming gratings
APPLIED MATERIALS INC3 citations73
US11456152B2Sep 27, 2022
Modulation of rolling K vectors of angled gratings
APPLIED MATERIALS INC2 citations73
US11380578B2Jul 5, 2022
Formation of angled gratings
APPLIED MATERIALS INC2 citations73
US11367589B2Jun 21, 2022
Modulation of ion beam angle
APPLIED MATERIALS INC1 citations73
US11226441B2Jan 18, 2022
Methods of producing slanted gratings with variable etch depths
APPLIED MATERIALS INC4 citations73
US11119405B2Sep 14, 2021
Techniques for forming angled structures
APPLIED MATERIALS INC5 citations73
US10763072B1Sep 1, 2020
Apparatus, system and techniques for mass analyzed ion beam
APPLIED MATERIALS INC2 citations73
US10607847B1Mar 31, 2020
Gate all around device and method of formation using angled ions
APPLIED MATERIALS INC4 citations73
US12106936B2Oct 1, 2024
Scanned angled etching apparatus and techniques providing separate co-linear radicals and ions
APPLIED MATERIALS INC2 citations72
US11715621B2Aug 1, 2023
Scanned angled etching apparatus and techniques providing separate co-linear radicals and ions
APPLIED MATERIALS INC3 citations72
US11335531B2May 17, 2022
Shadow mask apparatus and methods for variable etch depths
APPLIED MATERIALS INC2 citations68
US11810755B2Nov 7, 2023
Ion beam source for optical device fabrication using a segmented ion source having one or more angled surfaces
APPLIED MATERIALS INC0 citations63
US11640898B2May 2, 2023
Methods of optical device fabrication using an ion beam source
APPLIED MATERIALS INC0 citations63
GODET LUDOVIC
2 patentsVARIAN SEMICONDUCTOR EQUIPMENT ASS INC
2 patentsVARIAN SEMICONDUCTOR ASSOCIATE
1 patentShowing the top 50 of 117 patents by PatentIndex Score.