Inventor

EGRET SEBASTIEN

FR3 patents

⚠️ This page may combine multiple inventors who share the name “EGRET SEBASTIEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TIMBRE TECH INC

1 patent

US7467064B2Dec 16, 2008

Transforming metrology data from a semiconductor treatment system using multivariate analysis

TIMBRE TECH INC16 citations90

VUONG VI

1 patent

US8170833B2May 1, 2012

Transforming metrology data from a semiconductor treatment system using multivariate analysis

VUONG VI9 citations77

TOKYO ELECTRON LTD

1 patent

US8346506B2Jan 1, 2013

Transforming metrology data from a semiconductor treatment system using multivariate analysis

TOKYO ELECTRON LTD4 citations60