Inventor
MA JIN WON
KR5 patents
Patents
5 patentsUS11764064B2Sep 19, 2023
Monitoring device, monitoring method and method of manufacturing semiconductor device using reflectivity of wafer
SAMSUNG ELECTRONICS CO LTD2 citations68
US11158510B2Oct 26, 2021
Monitoring device, monitoring method and method of manufacturing semiconductor device using reflectivity of wafer
SAMSUNG ELECTRONICS CO LTD4 citations68
US12219753B2Feb 4, 2025
Method for fabricating a semiconductor device having a single crystal storage contact
SAMSUNG ELECTRONICS CO LTD0 citations60
US11877443B2Jan 16, 2024
Semiconductor device including a single crystal contact
SAMSUNG ELECTRONICS CO LTD1 citations60
US9646971B2May 9, 2017
Semiconductor devices including nanowire capacitors and fabricating methods thereof
SAMSUNG ELECTRONICS CO LTD1 citations51