Inventor
PETHE ABHIJIT JAYANT
US23 patents
⚠️ This page may combine multiple inventors who share the name “PETHE ABHIJIT JAYANT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
14 patentsUS9859368B2Jan 2, 2018
Integration methods to fabricate internal spacers for nanowire devices
INTEL CORP11 citations93
US10192783B2Jan 29, 2019
Gate contact structure over active gate and method to fabricate same
INTEL CORP4 citations83
US10847631B2Nov 24, 2020
Gate-all-around (GAA) transistors with nanowires on an isolation pedestal
INTEL CORP1 citations73
US10580860B2Mar 3, 2020
Integration methods to fabricate internal spacers for nanowire devices
INTEL CORP1 citations73
US10229981B2Mar 12, 2019
Gate-all-around (GAA) transistor with stacked nanowires on locally isolated substrate
INTEL CORP1 citations73
US11004739B2May 11, 2021
Gate contact structure over active gate and method to fabricate same
INTEL CORP1 citations72
US10121856B2Nov 6, 2018
Integration methods to fabricate internal spacers for nanowire devices
INTEL CORP1 citations63
US12278144B2Apr 15, 2025
Gate contact structure over active gate and method to fabricate same
INTEL CORP0 citations62
US11908934B2Feb 20, 2024
Semiconductor device having doped epitaxial region and its methods of fabrication
INTEL CORP0 citations61
US10957796B2Mar 23, 2021
Semiconductor device having doped epitaxial region and its methods of fabrication
INTEL CORP0 citations61
US9472399B2Oct 18, 2016
Three-dimensional germanium-based semiconductor devices formed on globally or locally isolated substrates
INTEL CORP2 citations61
US12294027B2May 6, 2025
Semiconductor device having doped epitaxial region and its methods of fabrication
INTEL CORP0 citations58
US10804357B2Oct 13, 2020
Integration methods to fabricate internal spacers for nanowire devices
INTEL CORP0 citations52
US10283589B2May 7, 2019
Integration methods to fabricate internal spacers for nanowire devices
INTEL CORP0 citations52
CAPPELLANI ANNALISA
3 patentsUS8735869B2May 27, 2014
Strained gate-all-around semiconductor devices formed on globally or locally isolated substrates
CAPPELLANI ANNALISA22 citations92
US9484272B2Nov 1, 2016
Methods for fabricating strained gate-all-around semiconductor devices by fin oxidation using an undercut etch-stop layer
CAPPELLANI ANNALISA4 citations84
US9041106B2May 26, 2015
Three-dimensional germanium-based semiconductor devices formed on globally or locally isolated substrates
CAPPELLANI ANNALISA9 citations82
SONY GROUP CORP
3 patentsUS12363967B2Jul 15, 2025
Integration methods to fabricate internal spacers for nanowire devices
SONY GROUP CORP0 citations63
US11869939B2Jan 9, 2024
Integration methods to fabricate internal spacers for nanowire devices
SONY GROUP CORP0 citations63
US11302777B2Apr 12, 2022
Integration methods to fabricate internal spacers for nanowire devices
SONY GROUP CORP0 citations63