Inventor
KJOLLER KEVIN
US28 patents
⚠️ This page may combine multiple inventors who share the name “KJOLLER KEVIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
PHOTOTHERMAL SPECTROSCOPY CORP
7 patentsUS10942116B2Mar 9, 2021
Method and apparatus for enhanced photo-thermal imaging and spectroscopy
PHOTOTHERMAL SPECTROSCOPY CORP26 citations93
US11002665B2May 11, 2021
Method and apparatus for enhanced photo-thermal imaging and spectroscopy
PHOTOTHERMAL SPECTROSCOPY CORP12 citations85
US10969405B2Apr 6, 2021
Method and apparatus for sub-diffraction infrared imaging and spectroscopy and complementary techniques
PHOTOTHERMAL SPECTROSCOPY CORP11 citations85
US12332168B2Jun 17, 2025
Method and apparatus for improved composite multi-wavelength photothermal infrared imaging
PHOTOTHERMAL SPECTROSCOPY CORP0 citations62
US12209950B2Jan 28, 2025
Method and apparatus for enhanced photo-thermal imaging and spectroscopy
PHOTOTHERMAL SPECTROSCOPY CORP0 citations62
US11680892B2Jun 20, 2023
Method and apparatus for enhanced photo-thermal imaging and spectroscopy
PHOTOTHERMAL SPECTROSCOPY CORP0 citations62
US12416566B2Sep 16, 2025
Automated spectroscopic analysis of micron-scale microplastic particles with optical photothermal infrared spectroscopy
PHOTOTHERMAL SPECTROSCOPY CORP0 citations60
BRUKER NANO INC
5 patentsUS10228388B2Mar 12, 2019
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
BRUKER NANO INC24 citations94
US10914755B2Feb 9, 2021
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
BRUKER NANO INC1 citations73
US11714103B2Aug 1, 2023
Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrared spectroscopy
BRUKER NANO INC0 citations62
US11226285B2Jan 18, 2022
Surface sensitive atomic force microscope based infrared spectroscopy
BRUKER NANO INC0 citations62
US10557789B2Feb 11, 2020
Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy
BRUKER NANO INC1 citations57
PRATER CRAIG
4 patentsUS9134341B2Sep 15, 2015
Multiple modulation heterodyne infrared spectroscopy
PRATER CRAIG33 citations94
US8646319B2Feb 11, 2014
Dynamic power control for nanoscale spectroscopy
PRATER CRAIG20 citations92
US8242448B2Aug 14, 2012
Dynamic power control, beam alignment and focus for nanoscale spectroscopy
PRATER CRAIG25 citations90
US8680467B2Mar 25, 2014
High frequency deflection measurement of IR absorption with a modulated IR source
PRATER CRAIG10 citations84
ANASYS INSTR
3 patentsUS9658247B2May 23, 2017
Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
ANASYS INSTR18 citations81
US9778282B2Oct 3, 2017
Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
ANASYS INSTR2 citations70
US10082523B2Sep 25, 2018
Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy
ANASYS INSTR1 citations49