Inventor
MAN XIN
JP27 patents
⚠️ This page may combine multiple inventors who share the name “MAN XIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH SCIENCE CORP
22 patentsUS9347896B2May 24, 2016
Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
HITACHI HIGH TECH SCIENCE CORP8 citations84
US8803111B2Aug 12, 2014
Sample preparation apparatus and sample preparation method
HITACHI HIGH TECH SCIENCE CORP9 citations83
US9966226B2May 8, 2018
Cross-section processing and observation method and cross-section processing and observation apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations73
US9934938B2Apr 3, 2018
Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium
HITACHI HIGH TECH SCIENCE CORP3 citations73
US9384941B2Jul 5, 2016
Charged particle beam apparatus and sample observation method
HITACHI HIGH TECH SCIENCE CORP2 citations62
US9202671B2Dec 1, 2015
Charged particle beam apparatus and sample processing method using charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations62
US9080945B2Jul 14, 2015
Cross-section processing and observation method and cross-section processing and observation apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations62
US9046472B2Jun 2, 2015
Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method
HITACHI HIGH TECH SCIENCE CORP2 citations62
US8853629B2Oct 7, 2014
Cross-section processing and observation method and cross-section processing and observation apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations62
US8642980B2Feb 4, 2014
Composite charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations62
US11114276B2Sep 7, 2021
Apparatus, method, and program for processing and observing cross section, and method of measuring shape
HITACHI HIGH TECH SCIENCE CORP0 citations52
US10096449B2Oct 9, 2018
Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations52
US9368323B2Jun 14, 2016
Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus
HITACHI HIGH TECH SCIENCE CORP1 citations52
US9245713B2Jan 26, 2016
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations52
US10692695B2Jun 23, 2020
Cross section processing observation method and charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations51
US11600463B2Mar 7, 2023
Cross-section observation device, and control method
HITACHI HIGH TECH SCIENCE CORP0 citations50
US9260782B2Feb 16, 2016
Sample preparation method
HITACHI HIGH TECH SCIENCE CORP0 citations49
US11424100B2Aug 23, 2022
Charged particle beam irradiation apparatus and control method
HITACHI HIGH TECH SCIENCE CORP0 citations48
US11335534B2May 17, 2022
Particle beam irradiation apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations48
US10242842B2Mar 26, 2019
Method for cross-section processing and observation and apparatus therefor
HITACHI HIGH TECH SCIENCE CORP0 citations41
US9318303B2Apr 19, 2016
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations41
US9287087B2Mar 15, 2016
Sample observation method, sample preparation method, and charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations41