Inventor
FURUYA TOSHIHIRO
JP14 patents
⚠️ This page may combine multiple inventors who share the name “FURUYA TOSHIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
13 patentsUS5001344AMar 19, 1991
Scanning electron microscope and method of processing the same
HITACHI LTD103 citations95
US4912313AMar 27, 1990
Method of measuring surface topography by using scanning electron microscope, and apparatus therefor
HITACHI LTD26 citations92
US4803358AFeb 7, 1989
Scanning electron microscope
HITACHI LTD39 citations92
US4907287AMar 6, 1990
Image correction system for scanning electron microscope
HITACHI LTD55 citations91
US4733074AMar 22, 1988
Sample surface structure measuring method
HITACHI LTD39 citations89
US4725730AFeb 16, 1988
System of automatically measuring sectional shape
HITACHI LTD22 citations82
US4912328AMar 27, 1990
Apparatus for improving the signal-to-noise ratio of image signals in a scan-type imaging system
HITACHI LTD7 citations74
US4835385AMay 30, 1989
Method of measuring sectional shape and a system therefor
HITACHI LTD7 citations74
US4755047AJul 5, 1988
Photometric stereoscopic shape measuring method
HITACHI LTD15 citations74
US4385317AMay 24, 1983
Specimen image display apparatus
HITACHI LTD12 citations73
US4817178AMar 28, 1989
Linear cursor representation method
HITACHI LTD4 citations63
US4791294ADec 13, 1988
Electron beam scanning method and scanning electron microscope
HITACHI LTD5 citations62
US4004149AJan 18, 1977
Apparatus for displaying image produced by electrically charged particle beam
HITACHI LTD4 citations62